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地震 ›› 2020, Vol. 40 ›› Issue (3): 167-178.doi: 10.12196/j.issn.1000-3274.2020.03.013

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一种短基线伸缩仪的设计与实现

李静渊1, 杨江1,2, 李农发1,2, 余剑锋1,2, 李震2   

  1. 1.中国地震局地震研究所, 湖北 武汉 430071;
    2.武汉地震科学仪器研究院有限公司, 湖北 武汉 430071
  • 收稿日期:2019-09-29 出版日期:2020-07-31 发布日期:2020-07-28
  • 通讯作者: 杨江,高级工程师。E-mail:meblor@whsii.com
  • 作者简介:李静渊(1995-),男,山西原平人,硕士研究生,主要从事防灾减灾仪器研究。
  • 基金资助:
    中国大陆综合地球物理场观测仪器研发专项(Y201804);湖北省技术创新专项重大项目(2019AAA053)

Design and Test of a Short Baseline Extensometer

LI Jing-yuan1, YANG Jiang1,2, LI Nong-fa1,2, YU Jian-feng1,2, LI Zhen2   

  1. 1. Institute of Seismology, CEA, Wuhan 430071, China;
    2. Wuhan Institute of Seismologic Instrument Co., Ltd., Wuhan 430071, China
  • Received:2019-09-29 Online:2020-07-31 Published:2020-07-28

摘要: SS-Y伸缩仪在中国地壳形变观测中已安装使用多年, 为了保证观测信噪比, 伸缩仪基线长度一般在10~30 m之间, 过长的基线导致仪器易受环境干扰的影响; 同时, 由于没有密封设计, 长期使用会出现格值误差等问题。针对SS-Y伸缩仪所存在的不足, 研制了一种新型短基线伸缩仪, 仪器基线长度为1 m, 采用具有较高精度的电容传感器进行位移测量, 并设计了全新的整体密封结构, 使仪器具备更好的抗干扰能力。线性度、 灵敏度等参数测试及观测试验结果表明, 该新型短基线伸缩仪具有良好的性能特性和观测信噪比, 这为仪器的进一步优化打下了基础。

关键词: 短基线, 伸缩仪, 环境干扰, 抗干扰能力, 信噪比

Abstract: SS-Y extensometer has been installed and used for many years in the crustal deformation observation. In order to ensure the observed signal-to-noise ratio, the length of the extensometer is generally between 10~30 m. The long baseline causes the instrument easy to be influenced by environmental interference. At the same time, due to the lack of sealed design, problems such as error of calibration may occur during long-time use. In order to solve these problems, this paper developed a new short-baseline extensometer. The instrument has a baseline length of 1 m. It uses a high-precision capacitive sensor for displacement measurement and a new overall sealing structure, which makes the instrument have a certain anti-interference ability. Through the linearity, sensitivity and other parameter tests and observation tests, it shows that the instrument has good performance characteristics and observed signal-to-noise ratio under the condition of short baseline, which lays a foundation for further optimization of the instrument.

Key words: Short baseline, Extensometer, Environmental interference, Anti-interference ability, Signal-to-noise ratio

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